Database providing access to the High Technology Network's industrial research offering: research competences, type of analyses and tests available at the Laboratories. Companies can consult the Catalogue to find Laboratories and researchers that match their needs.
Competence
Acquisition and pre-processing of signals for model identification
Biosensors (enzymes, cells, antibodies,analyte and ions)
Chemical, gas, indoor air quality sensors, Lab-on-Chip
Cloud interoperabilirty and portability
Cloud new roles: brokers, auditor, …
Cloud security
Cloud standards
Continuous-time and discrete-time mathematical modeling of systems and processes
Detectors of ionizing radiation (X-rays, gamma, radon)
Discrete events mathematical modeling of systems and processes
Electrical, power and magnetic sensors
Energy harvesting
Finite element simulation (FEM)
Formal languages for systems modeling (Unified Modeling Language-UML and SysML-System Modeling Language)
Generalized Virtualization
Identification of models and parameters estimation
Infinite-dimensional mathematical modeling of systems
Integrated electronics of control and front-end, with analysis of the accuracy of the acquisition chain
Interaction of Cloud and HPC
Management of Data Centers
Mechanical sensors (accelerometers, gyroscopes, strain gauges, microphones); Tactile , force, torque sensors. Doppler laser sensors
Modeling of the collision of bodies in mechanical systems
Non-parametric modeling (neural networks, etc.)
Optical sensors, waveguides and photonic structures, optics fibers
Packaging integration
SaaS, PaaS, IaaS
Satellite sensors (GPS, GLONASS, Galileo ....)
Sensors for flow, flow rate and pressure of liquids and gases, and for microfluidics
Sensors for thermodynamic parameters (temperature and heat flow)
Signal interface integration, wireless systems and wireless sensor networks
Simulation for discrete events models
Simulation for dynamic continuous-time and discrete-time models
Software for measuring instruments and measurements
Sofware Defined Networks
State of the art, norms analysis, standards and background art analysis of sensors
Validation of models and X-In-The-Loop (software in the loop and hardware in the loop)